Clean and in good condition, this is a pair of Picoprobes in storage case.
This pair was listed as fully functional by the releasing state facility.
They were stored together in this configuration though not necessarily as a functional match so if you are interested in just one of the probes in this set, contact us for a separate listing.
Hassle-free warranty
Product Details
The GGB Industries, Inc., MODEL 40A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 40A achieves an insertion loss of less than 0.8 db and a return loss of greater than 18 db through 40 GHz.
With its individually spring loaded, Beryllium-Copper, Tungsten, or Nickel tips, the Model 40A provides reliable contacts, even when probing non-planar structures. This reliable low resistance contact is one of the keys to providing highly repeatable measurements.
The Model 40A microwave probe also provides direct viewing of the probe tips for accurate positioning.
The Model 40A can be mounted in various adaptors for use with standard microwave probe stations or attached to thin blades for use with dc probe needles on a probe card or multi-contact wedge. Custom mounts are available as well.
Any pitch (tip spacing) from 25 to 2540 microns may be specified. The probe can be configured with Ground-Signal-Ground (G,S,G), Ground-Signal (G,S), or Signal-Ground (S,G) tip footprints.
Connection to the Model 40A is through a female K connector (2.9mm) which is 3.5mm connector compatible.
Features
- Durable RF probe
- Any pitch from 25 to 2540 microns
- DC to 40 GHz
- Insertion loss less than 0.8 db
- Return loss greater than 18 db
- Measurement repeatability better than -80db
- Individually spring loaded contacts
- BeCu , Tungsten or Nickel tips available
- Variety of footprints
- Patented coaxial design
- Available in thirteen styles
- Custom configurations available
Features
- Durable
- DC to 50 GHz
- Any pitch from 25 to 1250 microns
- Insertion loss less than 1.0 db
- Return loss greater than 18 db
- Measurement repeatability -80db
- Individually spring loaded contacts
- BeCu or Tungsten tips available
- Variety of Footprints
- Patented coaxial design
- Available in thirteen styles
- Custom configurations available
Flexible Tips for Flexible Probing
EEach Model 50A has patented, independently spring loaded tips. Because the tips are flexible they minimize circuit damage, increase probe life, and most importantly, provide a reliable individually spring loaded contact for each point. With a small amount of overdrive, the point scrubs the surface to make a reliable contact free of dust, dirt, and oxide contamination. The ability to view the exact contact area eases probe positioning and allows for the precise positioning necessary for good LRM calibrations. The flexible tips even allow probing of non-planar surfaces such as ceramic substrates and laser diode structures.
Probe Cards
The Model 50A as well as all of our RF probes can be mounted on standard 4.5 inch probe cards and/or custom-sized cards to provide a convenient method for testing wafers at high frequencies using standard automatic or manual probe stations. Picoprobe Probe Cards can incorporate our Model 50A probes for RF connections with DC needles for power and low frequency signals.
Coaxial Transmission Improves Performance
The Model 50A uses a precision miniature 50 ohm coaxial cable from the probe tips to the connector interface. The coaxial design provides lower loss and less radiation than coplanar designs. The miniature coaxial cable is fabricated from flexible Beryllium-Copper which greatly improves the probe’s durability.
Multi-Contact Wedges
Our unique Multi-Contact Wedge designs accommodate multiple RF and DC contacts on a single, compact adapter. This compact design provides the user with a convenient method for testing wafers at high frequencies using standard automatic or manual probe stations. The user can choose from a variety of wiring options for the DC or power needles and select any combination of 40, 50, 67, and/or 110 GHz RF probes.
